• DocumentCode
    2859814
  • Title

    Using verification technology for validation coverage analysis and test generation

  • Author

    Moundanos, Dinos ; Abraham, Jacob A.

  • Author_Institution
    Comput. Eng. Res. Center, Texas Univ., Austin, TX, USA
  • fYear
    1998
  • fDate
    26-30 Apr 1998
  • Firstpage
    254
  • Lastpage
    259
  • Abstract
    Despite great advances in Formal Verification (FV) simulation is still the primary means for design validation. The definition of pragmatic measures for the coverage achieved and the problem of automatic test generation (ATG) are of great importance. In this paper we introduce a new set of metrics, the Event Sequence Coverage Metrics (ESCMs). Our approach is based on an automatic method to extract the control flow of a circuit which can be explored for coverage analysis and ATG. We combine FV and traditional ATPG techniques to automatically generate sequences which traverse uncovered parts of the control graph or exercise uninstantiated control event sequences
  • Keywords
    automatic testing; circuit CAD; circuit analysis computing; design for testability; microprocessor chips; ATPG; Event Sequence Coverage Metrics; automatic test generation; control event sequences; control flow; control graph; coverage analysis; design validation; formal verification simulation; test generation; uncovered parts; validation coverage analysis; verification technology; Automatic generation control; Automatic test pattern generation; Automatic testing; Circuit simulation; Circuit testing; Computational modeling; Computer simulation; Design engineering; Hardware design languages; Jacobian matrices;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 1998. Proceedings. 16th IEEE
  • Conference_Location
    Monterey, CA
  • ISSN
    1093-0167
  • Print_ISBN
    0-8186-8436-4
  • Type

    conf

  • DOI
    10.1109/VTEST.1998.670877
  • Filename
    670877