Session 16 LSI design, testing and interfacing

Author

Joy, R.

Author_Institution

IBM Corp., Hopwell Junction, NY, USA

Volume

XXI

fYear

1978

fDate

15-17 Feb. 1978

Firstpage

211

Lastpage

211

Abstract

Presents a synopsis of the sessions held at the conference proceedings.

Keywords

LSI design; Testing and interfacing;

fLanguage

English

Publisher

ieee

Conference_Titel

Solid-State Circuits Conference. Digest of Technical Papers. 1978 IEEE International

Conference_Location

San Francisco, CA, USA

Type

DOI

10.1109/ISSCC.1978.1155764

Filename

1155764

Link To Document