• DocumentCode
    2864662
  • Title

    Copper redistribution layer process for GaAs MMICs

  • Author

    Takatani, Shinichiro ; Hsiao, Tim ; Wu, Kay ; Chen, Yu-Chiao ; Jia-Shyan Wu ; Jung-Tao Chung ; Cheng-Kuo Lin ; Tsai, Shu-Hsiao

  • Author_Institution
    WIN Semiconductors Corp., Kuei Shan Hsiang, Tao Yuan Shien, Taiwan 333
  • fYear
    2012
  • fDate
    17-22 June 2012
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    A new copper metallization process is proposed that fabricates a redistribution layer on GaAs MMICs (monolithic microwave integrated circuits). This process enables the placement of Cu bonding pads and Cu pillar bumps over an MMIC. PBO (polybenzoxazole) is used as the low-k dielectric polymer for isolation. The thickness of the PBO layer is designed to be 10 mm in order to minimize the parasitic capacitance introduced by bonding pads placed on the active region of a HEMT (high electron mobility transistor). A single-pole double-throw HEMT switch fabricated by the proposed process exhibits good RF performance with negligible effect of the bonding pads.
  • Keywords
    Bonding; HEMTs; Heterojunction bipolar transistors; Irrigation; MMICs; Silicon; Voltage-controlled oscillators; Copper; GaAs; HEMT; MMIC; low-k; polymer; redistribution layer; switch;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest (MTT), 2012 IEEE MTT-S International
  • Conference_Location
    Montreal, QC
  • ISSN
    0149-645X
  • Print_ISBN
    978-1-4673-1085-7
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2012.6259484
  • Filename
    6259484