• DocumentCode
    2864984
  • Title

    Validation of SDL-Based Architectural Design Models: New Coverage Criteria

  • Author

    Restrepo, Andy ; Wong, W. Eric

  • Author_Institution
    Dept. of Comput. Sci., Univ. of Texas at Dallas, Dallas, TX, USA
  • fYear
    2011
  • fDate
    27-29 June 2011
  • Firstpage
    51
  • Lastpage
    59
  • Abstract
    As the capability to automatically generate code from different models becomes more sophisticated, it is critical that these models be adequately tested for quality assurance prior to code generation. Although simulation-based blackbox testing strategies exist for these models, it is important that we also employ white-box testing strategies similar to those used to test implementation code. More precisely, we apply coverage testing to architectural design models represented by SDL (Specification and Description Language). Our previous study [30] defined a methodology for automatic test generation with respect to structural-based criteria such as all-node and all-edge. Now, we propose new coverage criteria such as n-step message transfer and sender-receiver round-trip, aiming at the communication between SDL processes.
  • Keywords
    program compilers; program testing; quality assurance; software architecture; software quality; specification languages; SDL-based architectural design models; automatic code generation; n-step message transfer; quality assurance; sender-receiver round-trip; simulation-based black-box testing strategies; specification and description language; white-box testing strategies; Computational modeling; Computer bugs; Industries; Software; Telecommunications; Testing; Unified modeling language; SDL (Specification and Description Language); architectural design models; coverage testing; white-box testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Secure Software Integration and Reliability Improvement (SSIRI), 2011 Fifth International Conference on
  • Conference_Location
    Jeju Island
  • Print_ISBN
    978-1-4577-0780-3
  • Electronic_ISBN
    978-0-7695-4453-3
  • Type

    conf

  • DOI
    10.1109/SSIRI.2011.29
  • Filename
    5992003