• DocumentCode
    2866695
  • Title

    Degradation free fast switching 1200 V 50 a silicon carbide BJT´s

  • Author

    Lindgren, Anders ; Domeij, Martin

  • Author_Institution
    TranSiC AB, Kista, Sweden
  • fYear
    2011
  • fDate
    6-11 March 2011
  • Firstpage
    1064
  • Lastpage
    1070
  • Abstract
    Silicon carbide (SiC) bipolar junction transistors (BJT´s) are normally-off fast switching devices with very low collector-emitter voltages (UCE), combining the best of properties from unipolar and bipolar technology. They switch fast with turnoffs from semi saturated state without current tails and have the same time extremely low saturated UCE values. SiC SBJT´s without bipolar degradation were fabricated and packaged in TO-247 packages. The BJT´s fabricated were characterized both statically and dynamically in a setup similar to a switching application, as well as tested for stability. A SPICE model was developed and simulations of the switching transitions were done and compared to measurements. Simulations of a boost converter were also done to show the efficiency improvements of a complete system made possible using this type of transistors.
  • Keywords
    SPICE; power bipolar transistors; silicon compounds; switching convertors; wide band gap semiconductors; SPICE model; SiC; TO-247 package; bipolar technology; boost converter; collector-emitter voltage; current 50 A; normally-off fast switching device; silicon carbide BJT; silicon carbide bipolar junction transistor; unipolar technology; voltage 1200 V; Capacitance; Current measurement; Silicon carbide; Switches; Temperature measurement; Transistors; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applied Power Electronics Conference and Exposition (APEC), 2011 Twenty-Sixth Annual IEEE
  • Conference_Location
    Fort Worth, TX
  • ISSN
    1048-2334
  • Print_ISBN
    978-1-4244-8084-5
  • Type

    conf

  • DOI
    10.1109/APEC.2011.5744726
  • Filename
    5744726