• DocumentCode
    2867910
  • Title

    A graph traversal based framework for sequential logic implication with an application to C-cycle redundancy identification

  • Author

    Zhao, Jian-Kun ; Newquist, Jefsrey A. ; Patel, Janak H.

  • Author_Institution
    Coordinated Sci. Lab., Illinois Univ., Urbana, IL, USA
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    163
  • Lastpage
    169
  • Abstract
    This paper presents a new graph traversal based framework for sequential logic implication called GRAPH-SIMP. Due to the prohibitive time and space cost, few previous works target the discovery of sequential indirect implications that span multiple time frames. By using an efficient graph data structure and incorporating a graph reduction step into the implication generation process, our approach provides an efficient support for sequential implication. Sequential logic implication has many useful applications, one of which is sequentially redundant fault identification. We show that sequential implications found by GRAPH SIMP allow us to find more sequential redundancies than previously reported. Results of testing our implication algorithm against ISCAS89 circuits show that high implication coverage is essential to identifying redundant faults
  • Keywords
    automatic test pattern generation; directed graphs; fault diagnosis; logic testing; redundancy; sequential circuits; C-cycle redundancy identification; GRAPH-SIMP; ISCAS89 circuits; graph data structure; graph reduction step; graph traversal based framework; implication generation process; multiple time frames; sequential logic; sequential logic implication; sequentially redundant fault identification; Automatic test pattern generation; Circuit analysis; Circuit faults; Circuit testing; Engines; Fault diagnosis; Laboratories; Logic circuits; Logic testing; Redundancy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design, 2001. Fourteenth International Conference on
  • Conference_Location
    Bangalore
  • ISSN
    1063-9667
  • Print_ISBN
    0-7695-0831-6
  • Type

    conf

  • DOI
    10.1109/ICVD.2001.902656
  • Filename
    902656