DocumentCode
2868796
Title
ELECTROMIGRATION EFFECTS IN VLSI DUE TO VARIOUS CURRENT TYPES
Author
Weis, E. ; Kinsbron, E. ; Snyder, M. ; Vogel, B. ; Croitoru, N.
fYear
1991
fDate
26-30 Oct 1991
Firstpage
354
Keywords
Circuit testing; Conductors; Current density; Electromigration; Fabrication; Life estimation; Lifetime estimation; Stress; Temperature; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1991, Proceedings., International
ISSN
1089-3539
Print_ISBN
0-8186-9156-5
Type
conf
DOI
10.1109/TEST.1991.519694
Filename
519694
Link To Document