• DocumentCode
    2869939
  • Title

    A numerical analysis for very small semiconductor devices

  • Author

    Yoshii, Ari ; Horiguchi, Shogo ; Sudo, Toshio

  • Author_Institution
    NTT Musashino Electrical Communication Lab., Tokyo, Japan
  • Volume
    XXIII
  • fYear
    1980
  • fDate
    13-15 Feb. 1980
  • Firstpage
    80
  • Lastpage
    81
  • Keywords
    Charge carrier processes; Electron devices; Finite difference methods; Finite element methods; Laboratories; Nonlinear equations; Numerical analysis; Poisson equations; Radiative recombination; Semiconductor devices;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference. Digest of Technical Papers. 1980 IEEE International
  • Conference_Location
    San Francisco, CA, USA
  • Type

    conf

  • DOI
    10.1109/ISSCC.1980.1156086
  • Filename
    1156086
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2869939