• DocumentCode
    2870405
  • Title

    A DENSELY INTEGRATED HIGH PERFORMANCE CMOS TESTER

  • Author

    Lesmeister, Gary

  • fYear
    1991
  • fDate
    26-30 Oct 1991
  • Firstpage
    426
  • Keywords
    CMOS process; CMOS technology; Circuit testing; Design methodology; Integrated circuit technology; Integrated circuit testing; Phase locked loops; System testing; Temperature distribution; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1991, Proceedings., International
  • ISSN
    1089-3539
  • Print_ISBN
    0-8186-9156-5
  • Type

    conf

  • DOI
    10.1109/TEST.1991.519703
  • Filename
    519703
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2870405