DocumentCode
2870954
Title
A self-testing ROM device
Author
Theus, U. ; Leutiger, H.
Author_Institution
Technical University of Aachen, Aachen, Germany
Volume
XXIV
fYear
1981
fDate
18-20 Feb. 1981
Firstpage
176
Lastpage
177
Abstract
A self-testing 1Kb ROM affording in the test mode functional conversion of peripheral subcircuits into test aids on the chip will be reported. Error coverage is better than 99.6% and area overhead is 15%.
Keywords
Automatic testing; Built-in self-test; Circuit testing; Counting circuits; Latches; Microprocessors; Production; Read only memory; Switches; Test pattern generators;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference. Digest of Technical Papers. 1981 IEEE International
Conference_Location
New York, NY, USA
Type
conf
DOI
10.1109/ISSCC.1981.1156147
Filename
1156147
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