• DocumentCode
    2872638
  • Title

    Using storage class memories to increase the reliability of two-dimensional RAID arrays

  • Author

    Pâris, Jehan-François ; Amer, Ahmed ; Long, Darrell D E

  • Author_Institution
    Dept. of Comput. Sci., Univ. of Houston Houston, Houston, TX, USA
  • fYear
    2009
  • fDate
    21-23 Sept. 2009
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    Two-dimensional RAID arrays maintain separate row and column parities for all their disks. Depending on their organization, they can tolerate between two and three concurrent disk failures without losing any data. We propose to enhance the robustness of these arrays by replacing a small fraction of these drives with storage class memory devices, and demonstrate how such a pairing is several times more reliable than relying on conventional disks alone, or simply augmenting popular redundant layouts. Depending on the ratio of the failure rates of these two devices, the substitution can double or even triple the mean time to data loss (MTTDL) of each array.
  • Keywords
    RAID; mean time to data loss; storage class memory devices; two-dimensional RAID arrays; Computer science; Disk drives; Error correction; Failure analysis; Memory; Proposals; Resilience; Robustness; Solid state circuits; Throughput; RAID arrays; disk arrays; stoage systems;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Modeling, Analysis & Simulation of Computer and Telecommunication Systems, 2009. MASCOTS '09. IEEE International Symposium on
  • Conference_Location
    London
  • ISSN
    1526-7539
  • Print_ISBN
    978-1-4244-4927-9
  • Electronic_ISBN
    1526-7539
  • Type

    conf

  • DOI
    10.1109/MASCOT.2009.5366760
  • Filename
    5366760