DocumentCode
2875300
Title
FAULT MODELING AND TESTING OF GaAs STATIC RANDOM ACCESS MEMORIES
Author
Mohan, S. ; Mazumder, P.
fYear
1991
fDate
26-30 Oct 1991
Firstpage
665
Keywords
Circuit faults; Circuit testing; Cryogenics; Failure analysis; Fault diagnosis; Gallium arsenide; Process design; Random access memory; Silicon; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1991, Proceedings., International
ISSN
1089-3539
Print_ISBN
0-8186-9156-5
Type
conf
DOI
10.1109/TEST.1991.519731
Filename
519731
Link To Document