• DocumentCode
    2875336
  • Title

    A 128K EPROM with redundancy

  • Author

    Spaw, W. ; Folmsbee, A. ; Canepa, G.

  • Author_Institution
    Intel Corp., Santa Clara, CA, USA
  • Volume
    XXV
  • fYear
    1982
  • fDate
    10-12 Feb. 1982
  • Firstpage
    112
  • Lastpage
    113
  • Abstract
    A 128K EPROM, which utilizes polysilicon fuses to select up to four rows of redundant elements, will be described. The device, with typical access time less than 200ns, features fully static operation and 21V single pulse programming.
  • Keywords
    CADCAM; Circuit testing; Computer aided manufacturing; Decoding; EPROM; Fuses; Pins; Random access memory; Software testing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference. Digest of Technical Papers. 1982 IEEE International
  • Conference_Location
    San Francisco, CA, USA
  • Type

    conf

  • DOI
    10.1109/ISSCC.1982.1156400
  • Filename
    1156400
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2875336