DocumentCode
2876255
Title
Modeling of stacked packaging thermal performance in module/system environment
Author
Tan, Guixiang ; Wu, Yinan
Author_Institution
Intel Corp, Hudson, MA, USA
fYear
2005
fDate
15-17 March 2005
Firstpage
270
Lastpage
274
Abstract
Package thermal performance is determined by package design and its environment in a system. In reality, it is often costly, and sometimes impossible to include all the detailed features of a package into its system thermal management simulation. This is particularly true for stacked packages due to the design complexity. This paper proposes a methodology to realistically model stacked packages by simplifying the detailed package using a compact model with correlated equivalent thermal performance through a design of experiment (DOE) approach. The correlation between the compact model and package detailed model showed a less than 6.5% error under various boundary conditions, and thus becomes a powerful tool for further evaluation and optimization of the package thermal design.
Keywords
design of experiments; thermal management (packaging); DOE; correlated equivalent thermal performance; design of experiment; modeling; module/system environment; package design; package thermal performance; stacked packaging; thermal management; Boundary conditions; Design optimization; Electronic packaging thermal management; Energy management; Monitoring; Power system modeling; Temperature distribution; Thermal conductivity; Thermal management; US Department of Energy;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Thermal Measurement and Management Symposium, 2005 IEEE Twenty First Annual IEEE
ISSN
1065-2221
Print_ISBN
0-7803-8985-9
Type
conf
DOI
10.1109/STHERM.2005.1412191
Filename
1412191
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