• DocumentCode
    2876255
  • Title

    Modeling of stacked packaging thermal performance in module/system environment

  • Author

    Tan, Guixiang ; Wu, Yinan

  • Author_Institution
    Intel Corp, Hudson, MA, USA
  • fYear
    2005
  • fDate
    15-17 March 2005
  • Firstpage
    270
  • Lastpage
    274
  • Abstract
    Package thermal performance is determined by package design and its environment in a system. In reality, it is often costly, and sometimes impossible to include all the detailed features of a package into its system thermal management simulation. This is particularly true for stacked packages due to the design complexity. This paper proposes a methodology to realistically model stacked packages by simplifying the detailed package using a compact model with correlated equivalent thermal performance through a design of experiment (DOE) approach. The correlation between the compact model and package detailed model showed a less than 6.5% error under various boundary conditions, and thus becomes a powerful tool for further evaluation and optimization of the package thermal design.
  • Keywords
    design of experiments; thermal management (packaging); DOE; correlated equivalent thermal performance; design of experiment; modeling; module/system environment; package design; package thermal performance; stacked packaging; thermal management; Boundary conditions; Design optimization; Electronic packaging thermal management; Energy management; Monitoring; Power system modeling; Temperature distribution; Thermal conductivity; Thermal management; US Department of Energy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Thermal Measurement and Management Symposium, 2005 IEEE Twenty First Annual IEEE
  • ISSN
    1065-2221
  • Print_ISBN
    0-7803-8985-9
  • Type

    conf

  • DOI
    10.1109/STHERM.2005.1412191
  • Filename
    1412191