• DocumentCode
    2876442
  • Title

    CMOS technology directions

  • Author

    Rodgers, T.

  • Author_Institution
    INTJR Corp., Woodside, CA, USA
  • Volume
    XXVI
  • fYear
    1983
  • fDate
    23-25 Feb. 1983
  • Firstpage
    210
  • Lastpage
    211
  • Abstract
    Unlike NMOS technology, which has been relatively standardized by the industry, CMOS technology is currently much more varied in its methods of production. Presently, the following alternatives (and related issues) exist: bulk CMOS versus CMOS-SOS (cost, yield, performance), P-well versus N-well architecture (performance, latch-up, immunity, alpha immunity), epitaxial versus non-epitaxial substrates (latch-up, alphas, cost, yield) and single versus double poly processing (density, cost, performance). In the future, decisions regarding new isolation techniques (e.g., slot), new interconnect layers (e.g., silicides), and methods for soft-error immunity (e.g., buried layers), may cause a further fragmentation of the CMOS technology.
  • Keywords
    Appropriate technology; CMOS process; CMOS technology; Engineering management; Isolation technology; MOS devices; Research and development management; Silicon on insulator technology; Substrates; Technology management;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference. Digest of Technical Papers. 1983 IEEE International
  • Conference_Location
    New York, NY, USA
  • Type

    conf

  • DOI
    10.1109/ISSCC.1983.1156464
  • Filename
    1156464