DocumentCode
2876442
Title
CMOS technology directions
Author
Rodgers, T.
Author_Institution
INTJR Corp., Woodside, CA, USA
Volume
XXVI
fYear
1983
fDate
23-25 Feb. 1983
Firstpage
210
Lastpage
211
Abstract
Unlike NMOS technology, which has been relatively standardized by the industry, CMOS technology is currently much more varied in its methods of production. Presently, the following alternatives (and related issues) exist: bulk CMOS versus CMOS-SOS (cost, yield, performance), P-well versus N-well architecture (performance, latch-up, immunity, alpha immunity), epitaxial versus non-epitaxial substrates (latch-up, alphas, cost, yield) and single versus double poly processing (density, cost, performance). In the future, decisions regarding new isolation techniques (e.g., slot), new interconnect layers (e.g., silicides), and methods for soft-error immunity (e.g., buried layers), may cause a further fragmentation of the CMOS technology.
Keywords
Appropriate technology; CMOS process; CMOS technology; Engineering management; Isolation technology; MOS devices; Research and development management; Silicon on insulator technology; Substrates; Technology management;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference. Digest of Technical Papers. 1983 IEEE International
Conference_Location
New York, NY, USA
Type
conf
DOI
10.1109/ISSCC.1983.1156464
Filename
1156464
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