• DocumentCode
    2876458
  • Title

    Chip/Package Design and Technology Trade-offs in the 65nm Cell Broadband Engine

  • Author

    Harvey, P. ; Zhou, Yangzhong ; Yamada, G. ; Questad, D. ; Lafontant, G. ; Mandrekar, R. ; Suminaga, S. ; Yamaji, Yuto ; Noma, Haruo ; Nishio, Takayuki ; Mori, Hisamichi ; Tamura, Takuya ; Yazawa, Kazuki ; Takiguchi ; Ohde, T. ; White, Robert V. ; Malhotra

  • Author_Institution
    IBM Syst. & Technol. Group, Austin
  • fYear
    2007
  • fDate
    May 29 2007-June 1 2007
  • Firstpage
    27
  • Lastpage
    34
  • Abstract
    Technology migration of the Cell Broadband Enginetrade (BE) Microprocessor to 65 nm chip technology precipitated a redesign of the original IC packaging. While many of the design changes were necessitated by the chip technology migration, other modifications were implemented to enhance the robustness and overall manufacturability of the product. This paper will discuss key aspects of the 65nm chip technology that drove changes to the package design and also describe some of the modifications to enhance the manufacturability of the product. The paper will outline the statistical analysis, modeling, simulation and characterization employed in the electrical and thermal design, specification and tolerancing of the microprocessor package. The paper will be of specific interest to those involved in the cost-effective, high performance IC package design and development and will be of general interest to those developing and refining analysis methods employed in overall design and technology trade-offs in advanced packaging.
  • Keywords
    integrated circuit packaging; microprocessor chips; IC packaging; cell broadband engine microprocessor; chip-package design; microprocessor package; size 65 nm; technology trade-offs; CMOS process; CMOS technology; Cost function; Electronic packaging thermal management; Electronics packaging; Engines; Integrated circuit packaging; Microprocessors; Plastic packaging; Semiconductor device packaging;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2007. ECTC '07. Proceedings. 57th
  • Conference_Location
    Reno, NV
  • ISSN
    0569-5503
  • Print_ISBN
    1-4244-0985-3
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2007.373772
  • Filename
    4249858