Reconfiguration algorithm for low temperature sub-array on VLSI/WSI arrays with faults

Temperature of the processing elements on integrated circuit threaten the reliability and performance of a hard real-time system. This paper presents a temperature-aware algorithm to reconfigure two-dimensional m × n VLSI/WSI arrays linked by 4-port switches in the presence of faulty processing elements. Based on dynamic programming, the proposed algorithm constructs each logical column with the lowest temperature for a cool target array on a given host array. Simulation results show that the temperature of target array is reduced without loss of harvest in comparison to the state-of-the-art.