DocumentCode
2877202
Title
DELAY TESTING OF DIGITAL CIRCUITS BY OUTPUT WAVEFORM ANALYSIS
Author
Franco, Piero ; McCluskey, Edward J.
fYear
1991
fDate
26-30 Oct 1991
Firstpage
798
Keywords
Circuit faults; Circuit testing; Delay effects; Digital circuits; Electrical fault detection; Fault detection; Logic circuits; Propagation delay; Sampling methods; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1991, Proceedings., International
ISSN
1089-3539
Print_ISBN
0-8186-9156-5
Type
conf
DOI
10.1109/TEST.1991.519745
Filename
519745
Link To Document