Masquerader Detection Using OCLEP: One-Class Classification Using Length Statistics of Emerging Patterns

We introduce a new method for masquerader detection that only uses a user¿s own data for training, called Oneclass Classification using Length statistics of Emerging Patterns (OCLEP). Emerging patterns (EPs) are patterns whose support increases from one dataset/class to another with a big ratio, and have been very useful in earlier studies. OCLEP classifies a case T as self or masquerader by using the average length of EPs obtained by contrasting T against sets of samples of a user¿s normal data. It is based on the observation that one needs long EPs to differentiate instances from a common class, but needs short EPs to differentiate instances from different classes. OCLEP has two novel features: for training it uses EPs mined from just the self class; for classification it uses the length statistics instead of the EPs themselves. Experiments show that OCLEP can achieve very good accuracy while keeping the false positive rate low, it achieves slightly better area-under-ROC-curve than SVM, and it can achieve good results when other approaches can not. OCLEP requires little effort in choosing parameters; the SVM requires significant tuning and it is hard to reach the theoretical optimal result. These features imply that OCLEP is a good complementary component for a robust masquerader detection system, even though its average performance in false positive rate is not as good as SVM¿s.