DocumentCode
2877382
Title
Delay Testing Quality in Timing-Optimized Designs
Author
Park, Eun Sei ; Underwood, Bill ; Williams, T.W. ; Mercer, M. Ray
fYear
1991
fDate
26-30 Oct 1991
Firstpage
897
Keywords
Circuit faults; Circuit testing; Clocks; Delay; Density functional theory; Design automation; Logic testing; Manufacturing processes; Network synthesis; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1991, Proceedings., International
ISSN
1089-3539
Print_ISBN
0-8186-9156-5
Type
conf
DOI
10.1109/TEST.1991.519756
Filename
519756
Link To Document