DocumentCode
2877643
Title
Design and Implementation of a Fault Attack Platform for Smart IC Card
Author
Jun Guo ; Liji Wu ; Xiangming Zhang ; Xiangyu Li
Author_Institution
Nat. Lab. for Inf. Sci. & Technol., Tsinghua Univ., Beijing, China
fYear
2012
fDate
17-18 Nov. 2012
Firstpage
653
Lastpage
656
Abstract
Fault attack is a kind of attack that the attacker injects faults into the hardware and the secret key is likely to be revealed. The paper will describe a fault attack platform for smart card. This platform includes PC terminal serial console software, smart card interface circuits, and smart card reader fault attack circuits. Then the fault platform could communicate with the contact smart card or the smart card reader by complying with the protocol of ISO/IEC 7816. Using this fault platform, we can inject any glitches on power and clock when the smart card is running the encryption command. And then the fault attack platform can send wrong cipher text to the PC terminal console software through by serial port. We can analyze the fault data by MATLAB or software programming to crack the key of the smart card. So, the security of smart card could be verified. The glitch of voltage range could be from 0v to 5v. And the scope of clock frequency can be from 1HZ to 50 MHZ.
Keywords
cryptographic protocols; data analysis; peripheral interfaces; smart cards; software fault tolerance; ISO/IEC 7816 protocol; MATLAB; PC terminal serial console software; ciphertext; encryption command; fault attack platform design; fault data analysis; fault injection; secret key; serial port; smart IC card; smart card interface circuits; smart card reader fault attack circuits; smart card security verification; software programming; voltage range; Circuit faults; Clocks; Encryption; Field programmable gate arrays; Smart cards; Software; ISO/IEC 7816; fault attack platform; smart card;
fLanguage
English
Publisher
ieee
Conference_Titel
Computational Intelligence and Security (CIS), 2012 Eighth International Conference on
Conference_Location
Guangzhou
Print_ISBN
978-1-4673-4725-9
Type
conf
DOI
10.1109/CIS.2012.150
Filename
6405920
Link To Document