Degradation model of LED based on accelerated life test

Author

Jang, Je Wook ; Choi, Seung Yoon ; Son, Joong Kon

Author_Institution

Samsung LED Co.Ltd., Suwon, South Korea

fYear

2011

fDate

4-7 July 2011

Firstpage

1

Lastpage

4

Abstract

ALT(accelerated life test) is a right choice to predict the lifetime of LED lighting source that is expected to have much longer lifetime than the conventional lighting sources. Middle power light-emitting diode (LED) accelerated life tests(ALT) were carried out by two kind of test methods (LED PKG level ALT and LED PKG component (chip, phosphor, premold) level ALT). The predicted curve by using component ALT model contained an inflection point caused by degradation characteristics of PKG component (premold). Therefore, we expect that component accelerated model is more accurate and more logical than simple extrapolation methods as used by LM80 and TM21.

Keywords

life testing; light emitting diodes; LED PKG level; LED lighting source lifetime; accelerated life test; component accelerated model; degradation model; predicted curve; Acceleration; Degradation; Life estimation; Light emitting diodes; Phosphors; Predictive models; Temperature measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Physical and Failure Analysis of Integrated Circuits (IPFA), 2011 18th IEEE International Symposium on the

Conference_Location

Incheon

ISSN

1946-1542

Print_ISBN

978-1-4577-0159-7

Electronic_ISBN

1946-1542

Type

conf

DOI

10.1109/IPFA.2011.5992771

Filename

5992771