Multiple parameter characterizations for electron beam with diffraction radiation

There are growing interests in developing non-intercepting method for real-time monitoring electron beam parameters for international linear collider (ILC) and X-ray free electron lasers (XFEL). In this paper we briefly review the theories on using optical and coherent diffraction radiation (ODR and CDR) to measure electron beam profile, divergence, emittance and bunch length. We focus on using ODR to direct image electron beam profile. A new method for bunch length measurement with diffraction radiation deflector is introduced. We also report the preliminary study on radiation spectrum distortion that generally occurs when using CDR to measure bunch length with Martin-Puplett or Michelson interferometers.