DocumentCode
2878240
Title
Mechanical Properties of Lead-Free Solders
Author
Darveaux, Robert ; Reichman, Corey
Author_Institution
Amkor Technol., Inc., Chandler
fYear
2007
fDate
May 29 2007-June 1 2007
Firstpage
695
Lastpage
706
Abstract
Mechanical testing of solder joint arrays was used to characterize lead-free solder alloys under both shear and tensile loading. The alloys studied included Sn4.0Ag0.5Cu, Sn3.5Ag, Sn0.7Cu, Sn3.0Ag0.5Cu, and Sn1.2Ag0.5Cu0.05Ni. All of the lead-free alloys exhibited time and temperature dependent creep behavior over the entire temperature range from -55 C to 125 C. A SINH creep law was effective in describing the steady state creep behavior over the entire range of conditions. Lead-free alloy strength increases with increasing Ag content. The relative strength of tin-lead versus lead-free alloys depends on the strain rate and temperature regime. At high strain rates and low temperatures, eutectic tin-lead is the strongest alloy. At low strain rates and high temperatures, eutectic tin-lead is the lowest strength alloy. Simulated stress-strain hysteresis loops for both accelerated test and field use conditions showed dramatic differences between the various alloys. Higher Ag content results in a larger stress range but a smaller strain range during temperature cycling.
Keywords
copper alloys; creep; eutectic alloys; lead alloys; mechanical testing; silver alloys; solders; tin alloys; SnAgCu; eutectic tin-lead; lead-free alloys; lead-free solders; mechanical properties; mechanical testing; solder joint arrays; temperature cycling; temperature dependent creep behavior; Capacitive sensors; Creep; Environmentally friendly manufacturing techniques; Lead; Mechanical factors; Soldering; Steady-state; Temperature dependence; Temperature distribution; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 2007. ECTC '07. Proceedings. 57th
Conference_Location
Reno, NV
ISSN
0569-5503
Print_ISBN
1-4244-0985-3
Electronic_ISBN
0569-5503
Type
conf
DOI
10.1109/ECTC.2007.373872
Filename
4249958
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