• DocumentCode
    2878258
  • Title

    Novel technique to remove measurement noise generated by pinhole diffraction phenomenon

  • Author

    Youk, Youngchun ; Kim, Dug Young

  • Author_Institution
    Dept. of Inf. & Commun., Gwangju Inst. of Sci. & Technol., Gwangju
  • fYear
    2006
  • fDate
    21-26 May 2006
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    We have developed a novel technique to remove measurement noise generated by pinhole diffraction in confocal microscopy. We compared the refractive index measurement results using our technique with those obtained using a traditional system.
  • Keywords
    diffraction; noise measurement; refractive index measurement; scanning electron microscopy; confocal microscopy; measurement noise removal; pinhole diffraction; refractive index measurement; Detectors; Noise generators; Noise measurement; Optical diffraction; Optical microscopy; Optical noise; Optical refraction; Optical variables control; Optical waveguides; Refractive index; (180.1790) Confocal microscopy; (290.3030) Index measurements;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics, 2006 and 2006 Quantum Electronics and Laser Science Conference. CLEO/QELS 2006. Conference on
  • Conference_Location
    Long Beach, CA
  • Print_ISBN
    978-1-55752-813-1
  • Electronic_ISBN
    978-1-55752-813-1
  • Type

    conf

  • DOI
    10.1109/CLEO.2006.4628660
  • Filename
    4628660
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2878258