• DocumentCode
    2878991
  • Title

    Characterization of the bistatic scattered distribution

  • Author

    Daout, F. ; Schmitt, F.

  • Author_Institution
    Groupe de Traitement du Signal, Ecole Navale Batiment des Labs., Brest Naval, France
  • Volume
    5
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    2745
  • Abstract
    The bistatic scattering from a rough surface is simulated by a computer program for a wide angles range. The effect of shadowing and multiple scattering are taken into account. To describe the scattered field the Kirchhoff theory is used. The probability density functions (pdf) of normalized scattering pressure (modulus) are compared with the Weibull, lognormal and K-distribution pdf. The phase distribution are also studied. The values of the distribution parameters estimated using maximum likelihood (ML) estimators are obtained. The Kolmogorov-Smirnov goodness of fit test is used to determine which of the distribution fits the data better. It is observed that the effect of the size of the illuminated area is important on the phase distribution
  • Keywords
    geophysical techniques; radar cross-sections; radar theory; remote sensing by radar; rough surfaces; terrain mapping; K-distribution; Kirchhoff theory; Kolmogorov-Smirnov goodness of fit test; Weibull distribution; bistatic radar; bistatic scattered distribution; bistatic scattering; geophysical measurement technique; land surface; lognormal distribution; maximum likelihood estimator; model; multiple scattering; normalized scattering pressure; phase distribution; probability density function; radar remote sensing; radar scattering; rough surface; shadowing; simulation; terrain mapping; Computational modeling; Computer simulation; Maximum likelihood estimation; Parameter estimation; Probability density function; Rough surfaces; Scattering; Shadow mapping; Surface roughness; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Geoscience and Remote Sensing Symposium, 1999. IGARSS '99 Proceedings. IEEE 1999 International
  • Conference_Location
    Hamburg
  • Print_ISBN
    0-7803-5207-6
  • Type

    conf

  • DOI
    10.1109/IGARSS.1999.771638
  • Filename
    771638