• DocumentCode
    2879645
  • Title

    On-Chip Millimeter-Wave Library Device - Scalable Wilkinson Power Divier/Combiner

  • Author

    Ding, Hanyi ; Lam, Kwanhim ; Mina, Essam ; Rascoe, Jay ; Jordan, Donald ; Zeeb, Adam ; Gaucher, Brian

  • Author_Institution
    IBM Semicond. Res. & Dev. Center, Essex Junction
  • fYear
    2007
  • fDate
    May 29 2007-June 1 2007
  • Firstpage
    1246
  • Lastpage
    1251
  • Abstract
    On-chip millimeter wave Wilkinson power divider has been developed with the back end of line (BEOL) wiring and enabled as a library device in a 0.13 mum BiCMOS process design kit. The device layout and model are fully scalable, i.e. users can design a power divider at different frequencies or in different reference characteristic impedance systems by inputting the dimensions. Excellent model and hardware correlation has been observed up to 110 GHz. The measured results show that very good performance on-chip Wilkinson power dividers have been obtained in this technology, such as less than about 0.1 dB amplitude imbalance, about 0.8 dB of insertion loss with bandwidth of about 15% of the design frequency (defined at 15 dB return loss level) and about 20 dB of isolations. In addition, the device is the design rule check (DRC) clean and the layout versus schematic (LVS) enabled, which help to shorten the design cycle.
  • Keywords
    BiCMOS integrated circuits; MIMIC; integrated circuit layout; power combiners; power dividers; BEOL wiring; BiCMOS process design; back end-of-line wiring; design rule check; layout versus schematic; on-chip millimeter-wave library device; scalable Wilkinson power combiner; scalable Wilkinson power divider; size 0.13 mum; BiCMOS integrated circuits; Frequency conversion; Impedance; Libraries; Millimeter wave devices; Millimeter wave technology; Power dividers; Power system modeling; Process design; Wiring;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2007. ECTC '07. Proceedings. 57th
  • Conference_Location
    Reno, NV
  • ISSN
    0569-5503
  • Print_ISBN
    1-4244-0985-3
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2007.373954
  • Filename
    4250040