• DocumentCode
    2880432
  • Title

    Intrabeam scattering and touscheck lifetime for the optical stochastic cooling experiment at the MIT-Bates South Hall ring

  • Author

    Wang, F. ; Franklin, W. ; Van der Laan, J. ; Tschalär, C. ; Wang, D.

  • Author_Institution
    MIT, Middleton
  • fYear
    2007
  • fDate
    25-29 June 2007
  • Firstpage
    4279
  • Lastpage
    4281
  • Abstract
    A proof-of-principle experiment of optical stochastic cooling (OSC) at the MIT-Bates South Hall electron storage ring (SHR) has been proposed. To produce convincing cooling results, the ring will be run near 300 MeV. Beam emittance growth caused by Intrabeam scattering (IBS) is a major concern for the design of experiment. Touschek scattering imposes a dominant limit on beam lifetime. Evaluation of these effects is part of the design optimization process. Simulation analyses of cooling for a viable OSC experiment are presented.
  • Keywords
    particle beam dynamics; particle beam stability; storage rings; Touscheck lifetime; Touschek scattering; beam emittance growth; beam lifetime; electron storage ring; intrabeam scattering; optical stochastic cooling; Cooling; Design optimization; Electron optics; Optical design; Optical scattering; Particle scattering; Stimulated emission; Stochastic processes; Testing; Undulators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Particle Accelerator Conference, 2007. PAC. IEEE
  • Conference_Location
    Albuquerque, NM
  • Print_ISBN
    978-1-4244-0916-7
  • Type

    conf

  • DOI
    10.1109/PAC.2007.4440092
  • Filename
    4440092