• DocumentCode
    2881235
  • Title

    A 1ns 20K CMOS gate array series with configurable 15ns 12K memory

  • Author

    Takayama, Yoichiro ; Fujii, Shohei ; Tanabe, Takasumi ; Kawauchi, Kiyoto ; Yoshida, Takafumi ; Yamashita, Katsumi

  • Author_Institution
    Fujitsu, Ltd., Kawasaki, Japan
  • Volume
    XXVIII
  • fYear
    1985
  • fDate
    13-15 Feb. 1985
  • Firstpage
    196
  • Lastpage
    197
  • Abstract
    A CMOS array providing a maximum of 20,000 logic gates or logic and memory will be described. Typical gate delays of 1.0ns and memory access time of 15ns have been obtained using a 1.5μ twin tub process.
  • Keywords
    CMOS technology; Circuit testing; Clocks; Logic arrays; Logic circuits; Logic testing; Pins; Random access memory; Read-write memory; Wiring;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference. Digest of Technical Papers. 1985 IEEE International
  • Conference_Location
    New York, NY, USA
  • Type

    conf

  • DOI
    10.1109/ISSCC.1985.1156742
  • Filename
    1156742