DocumentCode
2883525
Title
The HOY Tester-Can IC Testing Go Wireless?
Author
Wu, Cheng-Wen ; Huang, Chih-Tsun ; Huang, Shi-Yu ; Huang, Po-Chiun ; Chang, Tsin-Yuan ; Hsing, Yu-Tsao
Author_Institution
Dept. of Electr. Eng., National Tsing Hua Univ., Hsinchu
fYear
2006
fDate
26-28 April 2006
Firstpage
1
Lastpage
4
Abstract
Test cost is becoming a more and more significant portion of the cost structure in advanced semiconductor products. To address this issue, we propose HOY - a novel wireless test system with enhanced embedded test features. We present the concept, architecture, and test flow for future semiconductor products tested by HOY. Necessary technologies for the success of HOY also are presented, though most of which require further investigation. A preliminary demonstration system has been constructed, and experiments are being conducted
Keywords
integrated circuit testing; HOY tester; integrated circuit testing; semiconductor products; wireless test system; Automatic testing; Built-in self-test; Circuit testing; Costs; Fabrication; Frequency; Integrated circuit testing; Probes; Semiconductor device testing; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Design, Automation and Test, 2006 International Symposium on
Conference_Location
Hsinchu
Print_ISBN
1-4244-0179-8
Electronic_ISBN
1-4244-0180-1
Type
conf
DOI
10.1109/VDAT.2006.258155
Filename
4027527
Link To Document