• DocumentCode
    2883598
  • Title

    Finite element analysis of metallic thin window: An iterative process

  • Author

    Olivas, E.R.

  • Author_Institution
    LANL, Los Alamos
  • fYear
    2007
  • fDate
    25-29 June 2007
  • Firstpage
    551
  • Lastpage
    553
  • Abstract
    Thin windows are devices required by some particle accelerator physics experiments. These windows must be thin and light enough so they have a minimum effect on the beam. However, due to the boundary and loading conditions a window might observe; nonlinear structural behavior can occur from a number of different causes, such as geometric and material nonlinearities. If a structure experiences large plastic deformation, its changing geometric relationship can cause the structure to respond in a nonlinear manner. Material nonlinearities occur when the material´s stress-strain relation depends on the load history as in plasticity models. The method of analysis for this study entails an FEA analysis, in which the stress and displacement are solved for a metallic membrane; these results are then compared to results obtained from an iterative process in relating the stress and strain with respect to the deformed geometry of the membrane. In addition, experimental tests will be carried out to determine the membrane displacement from a prescribed load. The study is conducted on 1145-O series Al.
  • Keywords
    finite element analysis; iterative methods; particle accelerator accessories; plastic deformation; stress analysis; stress-strain relations; Al; finite element analysis; iterative process; metallic thin window; particle accelerator physics; plastic deformation; stress-strain relation; Biomembranes; Capacitive sensors; Finite element methods; Geometry; History; Iterative methods; Linear particle accelerator; Physics; Plastics; Stress;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Particle Accelerator Conference, 2007. PAC. IEEE
  • Conference_Location
    Albuquerque, NM
  • Print_ISBN
    978-1-4244-0916-7
  • Type

    conf

  • DOI
    10.1109/PAC.2007.4440275
  • Filename
    4440275