• DocumentCode
    2885527
  • Title

    Dn-based design quality comparison of industrial Java applications

  • Author

    Roubtsov, Serguei ; Serebrenik, Alexander ; van den Brand, Mark

  • Author_Institution
    Tech. Univ. Eindhoven, Eindhoven, Netherlands
  • fYear
    2009
  • fDate
    28-29 Oct. 2009
  • Firstpage
    95
  • Lastpage
    101
  • Abstract
    The normalized distance from the main sequence, denoted Dn, is a popular object-oriented metric introduced by Martin in 1994. While the metric has been designed for assessment of individual packages it has also been applied in practice to quality assessment of entire software architectures. This gap between the industrial practice and theoretical understanding has been recently addressed for Java open-source systems. Based on study of a benchmarks collection the authors proposed a statistical model characterizing (a) the average value of Dn, and (b) distribution of Dn. Contribution of the current work is twofold. First, we show feasibility of application of the Dn-based assessment above to commercial Java applications. Second, we validate the approach by showing that the results obtained are consistent with those obtained by means of a series of independent studies, such as layering, presence of cyclic dependencies and Chidamber´s and Kemerer´s metrics.
  • Keywords
    Java; software architecture; software metrics; Dn-based design quality comparison; Java open-source system; industrial Java application; object-oriented metric; quality assessment; software architecture; Application software; Java; Object oriented modeling; Open source software; Packaging; Quality assessment; Software architecture; Software maintenance; Software metrics; Software packages; Java; maintainability; software architecture; software metrics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Software Engineering Conference in Russia (CEE-SECR), 2009 5th Central and Eastern European
  • Conference_Location
    Moscow
  • Print_ISBN
    978-1-4244-5664-2
  • Electronic_ISBN
    978-1-4244-5665-9
  • Type

    conf

  • DOI
    10.1109/CEE-SECR.2009.5501182
  • Filename
    5501182