DocumentCode
2885877
Title
Interval test method for fault location of the analog circuit with element tolerance
Author
Bing-Kun, Xiong ; Yong-Gao, Yang
Author_Institution
Dept. of Electr. Eng., Tongji Univ., Shanghai, China
fYear
1991
fDate
16-17 Jun 1991
Firstpage
505
Abstract
The theory of interval algebra has been used for tolerance analysis in circuit design in recent years, but not yet applied to fault diagnosis. In this paper the authors present an interval test method for fault location of analog circuits with tolerance (DC linear or nonlinear). The method is based on the theory of interval analysis. The advantage of this method is that it is simple, intuitive and easy to compute
Keywords
algebra; analogue circuits; fault location; network analysis; testing; analog circuit; element tolerance; fault diagnosis; fault location; interval algebra; interval test method; tolerance analysis; Analog circuits; Circuit faults; Circuit testing; Equations; Fault diagnosis; Fault location; Jacobian matrices; Vectors;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 1991. Conference Proceedings, China., 1991 International Conference on
Conference_Location
Shenzhen
Type
conf
DOI
10.1109/CICCAS.1991.184401
Filename
184401
Link To Document