• DocumentCode
    2887167
  • Title

    Leakage current reduction in CMOS logic circuits

  • Author

    Lin, Heng-Yao ; Lin, Chi-Sheng ; Chiou, Lih-Yih ; Liu, Bin-Da

  • Author_Institution
    Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan
  • Volume
    1
  • fYear
    2004
  • fDate
    6-9 Dec. 2004
  • Firstpage
    349
  • Abstract
    In this paper, a novel logic gate design with low leakage is proposed. Traditionally, the subthreshold leakage through a logic gate depends on the applied input vector. In order to reduce leakage power, we stack an extra transistor in the large leakage path. The proposed structure induces low leakage current under all possible inputs. Compared to the conventional CMOS logic circuit design, the simulation results show that the proposed logic circuits not only reduce significant leakage power dissipation, but also keep similar circuit performance as conventional CMOS logic circuits
  • Keywords
    CMOS logic circuits; integrated circuit design; leakage currents; logic gates; transistor circuits; CMOS logic circuits; input vector; leakage current reduction; leakage power reduction; logic gate design; power dissipation; subthreshold leakage; transistor; CMOS logic circuits; CMOS technology; Couplings; Leakage current; Logic gates; MOSFET circuits; Stacking; Subthreshold current; Threshold voltage; Tunneling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2004. Proceedings. The 2004 IEEE Asia-Pacific Conference on
  • Conference_Location
    Tainan
  • Print_ISBN
    0-7803-8660-4
  • Type

    conf

  • DOI
    10.1109/APCCAS.2004.1412767
  • Filename
    1412767