Benchmarking the PSP Compact Model for MOS Transistors

Author

Li, Xin ; Wu, Weimin ; Jha, Amit ; Gildenblat, Gennady ; Van Langevelde, Ronald ; Smit, Geert D J ; Scholten, Andries J. ; Klaassen, Dirk B M ; McAndrew, Colin C. ; Watts, Josef ; Olsen, Michael ; Coram, Geoffrey ; Chaudhry, Samir ; Victory, James

Author_Institution

Arizona State Univ., Tempe

fYear

2007

fDate

19-22 March 2007

Firstpage

259

Lastpage

264

Abstract

Recently, the PSP model was selected as the first surface-potential-based industry standard compact MOSFET model. This work presents the results of several qualitative "benchmark" tests that over the last two years were used to verify the physical behavior of the new model and its usefulness for future generations of CMOS IC design. These include newly developed tests and previously unavailable experimental data stemming from low-power, RF, mixed-signal, and analog applications of MOSFETs.

Keywords

CMOS integrated circuits; MOSFET; benchmark testing; semiconductor device models; semiconductor device testing; CMOS IC design; MOS transistors; MOSFET model; PSP compact model; benchmark tests; data stemming; Benchmark testing; Circuit testing; Integrated circuit modeling; Laboratories; MOSFET circuits; Microelectronics; Radio frequency; Research and development; Semiconductor device modeling; USA Councils;

fLanguage

English

Publisher

ieee

Conference_Titel

Microelectronic Test Structures, 2007. ICMTS '07. IEEE International Conference on

Conference_Location

Tokyo

Print_ISBN

1-4244-0781-8

Electronic_ISBN

1-4244-0781-8

Type

conf

DOI

10.1109/ICMTS.2007.374495

Filename

4252445