• DocumentCode
    2887793
  • Title

    Switching performance evaluation of commercial SiC power devices (SiC JFET and SiC MOSFET) in relation to the gate driver complexity

  • Author

    Pittini, Riccardo ; Zhe Zhang ; Andersen, Michael A. E.

  • Author_Institution
    Dept. of Electr. Eng., Tech. Univ. of Denmark, Lyngby, Denmark
  • fYear
    2013
  • fDate
    3-6 June 2013
  • Firstpage
    233
  • Lastpage
    239
  • Abstract
    Silicon Carbide (SiC) power devices can provide a significant improvement of power density and efficiency in power converters. The switching performances of SiC power devices are often a trade-off between the gate driver complexity and the desired performance; this is especially true for SiC BJTs and JFETs. The recent introduction of SiC MOSFET has proved that it is possible to have highly performing SiC devices with a minimum gate driver complexity; this made SiC power devices even more attractive despite their device cost. This paper presents an analysis based on experimental results of the switching losses of various commercially available Si and SiC power devices rated at 1200 V (Si IGBTs, SiC JFETs and SiC MOSFETs). The comparison evaluates the reduction of the switching losses which is achievable with the introduction of SiC power devices; this includes analysis and considerations on the gate driver complexity and cost.
  • Keywords
    bipolar transistors; insulated gate bipolar transistors; junction gate field effect transistors; power MOSFET; silicon compounds; switching convertors; BJT; IGBT; JFET; MOSFET; SiC; minimum gate driver complexity; power converters; power density; power devices; power efficiency; switching losses reduction; switching performance evaluation; voltage 1200 V; Switches; Gate Driver; SiC JFET; SiC MOSFET; Silicon Carbide (SiC); Switching losses;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ECCE Asia Downunder (ECCE Asia), 2013 IEEE
  • Conference_Location
    Melbourne, VIC
  • Print_ISBN
    978-1-4799-0483-9
  • Type

    conf

  • DOI
    10.1109/ECCE-Asia.2013.6579102
  • Filename
    6579102