DocumentCode
2888396
Title
WOM codes against inter-cell interference in NAND memories
Author
Li, Qing
Author_Institution
Comput. Sci. & Eng. Dept., Texas A&M Univ., College Station, TX, USA
fYear
2011
fDate
28-30 Sept. 2011
Firstpage
1416
Lastpage
1423
Abstract
Flash memories, especially NAND flash memories, are prevalent in the memory market due to their outstanding features such as high density and so on. However, the problems coming with the density are the parasitic effects, of which the cell-to-cell interference is the dominant one. Besides interference, another challenge for NAND flash memories is its limited life time. Actually, flash memories can be regarded as "write-once memories (WOM)", where cells can be changed from lower states to higher states, not vice versa. In this paper, we study WOM codes against cell-to-cell interference. We derive bounds of the rewriting capacity of WOM codes based on the new WOM codes, Delta-WOM, and constrained codes. We also explore efficient WOM code constructions: one construction is based on our Diamond-WOM codes construction, which can be proven to approach its known rewriting capacity; the other one is based on constrained codes.
Keywords
NAND circuits; flash memories; interference; write-once storage; NAND flash memories; cell-to-cell interference; delta-WOM codes; diamond-WOM codes; intercell interference; parasitic effects; rewriting capacity; write-once memories; Ash; Channel coding; Interference; Logic gates; Programming; Vectors;
fLanguage
English
Publisher
ieee
Conference_Titel
Communication, Control, and Computing (Allerton), 2011 49th Annual Allerton Conference on
Conference_Location
Monticello, IL
Print_ISBN
978-1-4577-1817-5
Type
conf
DOI
10.1109/Allerton.2011.6120334
Filename
6120334
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