• DocumentCode
    2890166
  • Title

    A Novel Tri-State Binary Phase Detector

  • Author

    Rennie, David ; Sachdev, Manoj

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Waterloo Univ., Ont.
  • fYear
    2007
  • fDate
    27-30 May 2007
  • Firstpage
    185
  • Lastpage
    188
  • Abstract
    In this paper a phase detector is introduced which has a similar phase detector response as the Alexander phase detector. Both the Alexander and proposed phase detector are analyzed with respect to their robustness. The analysis shows that the novel phase detector is more robust against process non-idealities than the Alexander, with a 75% reduction in the variation of static phase offsets. The proposed phase detector also consumes less power and requires less area. A CDR circuit which implements the proposed phase detector was designed and fabricated in a 0.18mum six metal layer standard CMOS process. The fabricated CDR circuit can lock to pseudo-random bit sequences (PRBS) up to 231 - 1 at data rates from 5 - 6.25Gb/s. For a PRBS of 231 - 1 at 6.25Gb/s the measured rms jitter and peak-to-peak jitter were 1.7ps and 11ps.
  • Keywords
    CMOS digital integrated circuits; clocks; phase detectors; random sequences; synchronisation; 0.18 micron; 1.7 ps; 11 ps; 5 to 62.5 Gbit/s; Alexander phase detector; CDR circuit; CMOS process; process nonidealities; pseudorandom bit sequences; tri-state binary phase detector; CMOS process; Circuits; Clocks; Costs; Data communication; Delay; Detectors; Jitter; Phase detection; Robustness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2007. ISCAS 2007. IEEE International Symposium on
  • Conference_Location
    New Orleans, LA
  • Print_ISBN
    1-4244-0920-9
  • Electronic_ISBN
    1-4244-0921-7
  • Type

    conf

  • DOI
    10.1109/ISCAS.2007.378307
  • Filename
    4252602