DocumentCode
2890166
Title
A Novel Tri-State Binary Phase Detector
Author
Rennie, David ; Sachdev, Manoj
Author_Institution
Dept. of Electr. & Comput. Eng., Waterloo Univ., Ont.
fYear
2007
fDate
27-30 May 2007
Firstpage
185
Lastpage
188
Abstract
In this paper a phase detector is introduced which has a similar phase detector response as the Alexander phase detector. Both the Alexander and proposed phase detector are analyzed with respect to their robustness. The analysis shows that the novel phase detector is more robust against process non-idealities than the Alexander, with a 75% reduction in the variation of static phase offsets. The proposed phase detector also consumes less power and requires less area. A CDR circuit which implements the proposed phase detector was designed and fabricated in a 0.18mum six metal layer standard CMOS process. The fabricated CDR circuit can lock to pseudo-random bit sequences (PRBS) up to 231 - 1 at data rates from 5 - 6.25Gb/s. For a PRBS of 231 - 1 at 6.25Gb/s the measured rms jitter and peak-to-peak jitter were 1.7ps and 11ps.
Keywords
CMOS digital integrated circuits; clocks; phase detectors; random sequences; synchronisation; 0.18 micron; 1.7 ps; 11 ps; 5 to 62.5 Gbit/s; Alexander phase detector; CDR circuit; CMOS process; process nonidealities; pseudorandom bit sequences; tri-state binary phase detector; CMOS process; Circuits; Clocks; Costs; Data communication; Delay; Detectors; Jitter; Phase detection; Robustness;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 2007. ISCAS 2007. IEEE International Symposium on
Conference_Location
New Orleans, LA
Print_ISBN
1-4244-0920-9
Electronic_ISBN
1-4244-0921-7
Type
conf
DOI
10.1109/ISCAS.2007.378307
Filename
4252602
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