DocumentCode
2890311
Title
Optimum electron bunch creation in a photoinjector using space-charge expansion
Author
Rosenzweig, J.B. ; Cook, A.M. ; Dunning, M. ; England, R.J. ; Musumeci, P. ; Bellaveglia, M. ; Boscolo, M. ; Catani, L. ; Cianchi, A. ; Pirro, G. Di ; Ferrario, M. ; Filippetto, D. ; Gatti, G. ; Palumbo, L. ; Vicario, C. ; Jones, S.
Author_Institution
Univ. of California Los Angeles, Los Angeles
fYear
2007
fDate
25-29 June 2007
Firstpage
3044
Lastpage
3046
Abstract
Recent studies have shown that by illuminating a photocathode with an ultra-short laser pulse of appropriate transverse profile, a uniform density, ellipsoidally shaped electron bunch can be dynamically formed. Linear space- charge fields then exist in all dimensions inside of the bunch, which minimizes emittance growth. Here we study this process, and its marriage to the standard emittance compensation scenario that is implemented in most modern photoinjectors. We show that the two processes are compatible, with simulations indicating that a very high brightness beam can be obtained. An initial time-resolved experiment has been performed at the SPARC injector in Frascati, involving Cerenkov radiation produced at an aerogel. We discuss the results of this preliminary experiment, as well as plans for future experiments at the UCLA Pegasus laboratory to resolve the ellipsoidal bunch shape at low energy. Future measurements at high energy based on fs resolution RF sweepers are discussed.
Keywords
electron beams; particle beam bunching; particle beam dynamics; space charge; Cerenkov radiation; RF sweepers; SPARC injector; electron bunch creation; ellipsoidally shaped electron bunch; emittance compensation scenario; linear space-charge fields; photoinjector; space-charge expansion; time-resolved experiment; Aerodynamics; Brightness; Cathodes; Electron beams; Free electron lasers; Laboratories; Optical pulse shaping; Physics; Shape; Surface emitting lasers;
fLanguage
English
Publisher
ieee
Conference_Titel
Particle Accelerator Conference, 2007. PAC. IEEE
Conference_Location
Albuquerque, NM
Print_ISBN
978-1-4244-0916-7
Type
conf
DOI
10.1109/PAC.2007.4440662
Filename
4440662
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