• DocumentCode
    2890326
  • Title

    [Front matter]

  • fYear
    2011
  • fDate
    13-15 July 2011
  • Abstract
    The following topics are dealt with: multicores; memory BIST; reliability evaluation; digital integrated circuits; and error correction.
  • Keywords
    built-in self test; digital integrated circuits; error correction; integrated circuit reliability; digital integrated circuits; error correction; memory BIST; multicores; reliability evaluation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    On-Line Testing Symposium (IOLTS), 2011 IEEE 17th International
  • Conference_Location
    Athens
  • Print_ISBN
    978-1-4577-1053-7
  • Type

    conf

  • DOI
    10.1109/IOLTS.2011.5993791
  • Filename
    5993791
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2890326