DocumentCode
2890672
Title
An ATPG-based approach to sequential logic optimization
Author
Cheng, K.-T.
Author_Institution
AT&T Bell Lab., Murray Hill, NJ, USA
fYear
1991
fDate
11-14 Nov. 1991
Firstpage
372
Lastpage
375
Abstract
The author proposes a method of redundancy identification for synchronous sequential circuits that do not have a global reset state. Derivations of conditions in which undetectable faults are redundant are presented. For a pure pipeline circuit or in a resettable circuit, a fault is undetectable (by three-valued-logic-based test generators) if and only if it is redundant. For general sequential circuits, undetectable faults are classified into three categories: (1) un-activatable faults, (2) un-propagatable faults, and (3) faults that are both activatable and propagatable, but cannot be simultaneously activated and propagated by any vector sequence. The author shows that class (1) and (2) faults are redundant faults while class (3) faults may not be. Algorithms for identifying un-activatable and un-propagatable faults are also described. These algorithms are implemented and incorporated in a redundancy removal system, MIRACLE. Experimental results on large MCNC sequential benchmark circuits are presented.<>
Keywords
automatic testing; logic CAD; logic testing; sequential circuits; ATPG-based approach; MIRACLE; benchmark circuits; global reset state; redundancy identification; redundancy removal system; resettable circuit; sequential logic optimization; synchronous sequential circuits; undetectable faults; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Flip-flops; Logic circuits; Logic testing; Redundancy; Sequential analysis; Sequential circuits;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer-Aided Design, 1991. ICCAD-91. Digest of Technical Papers., 1991 IEEE International Conference on
Conference_Location
Santa Clara, CA, USA
Print_ISBN
0-8186-2157-5
Type
conf
DOI
10.1109/ICCAD.1991.185279
Filename
185279
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