DocumentCode
2890757
Title
A reliable fault classifier for dependable systems on SRAM-based FPGAs
Author
Bolchini, Cristiana ; Sandionigi, Chiara ; Fossati, Luca ; Codinachs, David Merodio
Author_Institution
Dipt. di Elettron. e Inf., Politec. di Milano, Milan, Italy
fYear
2011
fDate
13-15 July 2011
Firstpage
92
Lastpage
97
Abstract
This paper presents an algorithm for the discrimination of faults in FPGAs based on their recovery possibility; some faults can be recovered by reconfiguring the faulty part of the device, others have a destructive effect. After classification has been carried out, the suitable fault recovery strategy is applied, with the final aim of enabling the exploitation of FPGAs, in particular SRAM-based ones, for critical applications, such as the ones in the space environment. In this scenario, we investigate the reliable implementation of the fault classification algorithm, that can be so integrated in an overall reliable system.
Keywords
SRAM chips; fault diagnosis; field programmable gate arrays; integrated circuit reliability; pattern classification; FPGA; SRAM; dependable systems; fault classification algorithm; fault recovery strategy; Algorithm design and analysis; Field programmable gate arrays; Orbits; Radiation detectors; Registers; Reliability; Single event upset;
fLanguage
English
Publisher
ieee
Conference_Titel
On-Line Testing Symposium (IOLTS), 2011 IEEE 17th International
Conference_Location
Athens
Print_ISBN
978-1-4577-1053-7
Type
conf
DOI
10.1109/IOLTS.2011.5993817
Filename
5993817
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