• DocumentCode
    2890757
  • Title

    A reliable fault classifier for dependable systems on SRAM-based FPGAs

  • Author

    Bolchini, Cristiana ; Sandionigi, Chiara ; Fossati, Luca ; Codinachs, David Merodio

  • Author_Institution
    Dipt. di Elettron. e Inf., Politec. di Milano, Milan, Italy
  • fYear
    2011
  • fDate
    13-15 July 2011
  • Firstpage
    92
  • Lastpage
    97
  • Abstract
    This paper presents an algorithm for the discrimination of faults in FPGAs based on their recovery possibility; some faults can be recovered by reconfiguring the faulty part of the device, others have a destructive effect. After classification has been carried out, the suitable fault recovery strategy is applied, with the final aim of enabling the exploitation of FPGAs, in particular SRAM-based ones, for critical applications, such as the ones in the space environment. In this scenario, we investigate the reliable implementation of the fault classification algorithm, that can be so integrated in an overall reliable system.
  • Keywords
    SRAM chips; fault diagnosis; field programmable gate arrays; integrated circuit reliability; pattern classification; FPGA; SRAM; dependable systems; fault classification algorithm; fault recovery strategy; Algorithm design and analysis; Field programmable gate arrays; Orbits; Radiation detectors; Registers; Reliability; Single event upset;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    On-Line Testing Symposium (IOLTS), 2011 IEEE 17th International
  • Conference_Location
    Athens
  • Print_ISBN
    978-1-4577-1053-7
  • Type

    conf

  • DOI
    10.1109/IOLTS.2011.5993817
  • Filename
    5993817