DocumentCode
2891573
Title
Ptimized Statistical Method For System-level ESD Tests
Author
Renninger, Robert G.
Author_Institution
AT&T Bell Laboratories Murray Hill, New Jersey 07974
fYear
1992
fDate
17-21 Aug. 1992
Firstpage
474
Lastpage
484
Keywords
Electrostatic discharge; Electrostatic measurements; Immune system; Immunity testing; Particle measurements; Power system modeling; Probability; Statistical analysis; System testing; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility, 1992. Symposium Record., IEEE 1992 International Symposium on
Conference_Location
Anaheim, CA, USA
Print_ISBN
0-7803-0713-5
Type
conf
DOI
10.1109/ISEMC.1992.626150
Filename
626150
Link To Document