DocumentCode

2894308

Title

The enhanced tunnel-diode logic circuit

Author

Sear, B. ; Cubert, J. ; Chow, W.

Author_Institution

Martin Marietta Corporation, Baltimore, MD, USA

Volume

VI

fYear

1963

fDate

20-22 Feb. 1963

Firstpage

26

Lastpage

27

Keywords

Bandwidth; Circuit testing; Clocks; Delay; Diodes; Impedance; Logic circuits; Low voltage; Resistors; Switches;

fLanguage

English

Publisher

ieee

Conference_Titel

Solid-State Circuits Conference. Digest of Technical Papers. 1963 IEEE International

Conference_Location

Philadelphia, PA, USA

Type

conf

DOI

10.1109/ISSCC.1963.1157454

Filename

1157454