• DocumentCode
    2894775
  • Title

    A side-channel and fault-attack resistant AES circuit working on duplicated complemented values

  • Author

    Doulcier-Verdier, Marion ; Dutertre, Jean-Max ; Fournier, Jacques ; Rigaud, Jean-Baptiste ; Robisson, Bruno ; Tria, Assia

  • Author_Institution
    CEA-LETI-MINATEC, Gardanne, France
  • fYear
    2011
  • fDate
    20-24 Feb. 2011
  • Firstpage
    274
  • Lastpage
    276
  • Abstract
    Cryptographic circuits can be subjected to several kinds of side-channel and fault attacks in order to extract the secret key. Side-channel attacks can be carried by measuring either the power consumed or the EM waves emitted by the cryptographic module and trying to find a correlation between the given side-channel and the data manipulated. Concerning fault attacks, in the case of differential fault attacks (DFA), a cryptographic calculation is corrupted in such a way as to retrieve information about the secret key. Faults can be induced by different means such as lasers, voltage glitches, electromagnetic perturbations or clock skews. Several counter-measures, like in, have been separately proposed to tackle either kind of attack. In this paper, we describe the implementation of an AES chip where duplicated and complemented data paths provide resistance against both side-channel and fault attacks.
  • Keywords
    cryptography; microprocessor chips; AES chip; DFA; EM waves; clock skew; cryptographic circuit; differential fault attack; electromagnetic perturbation; fault-attack resistant AES circuit; laser; side-channel attack resistant AES circuit; voltage glitches; Analytical models; Circuit faults; Computer science; Correlation; Cryptography; Logic gates; Semiconductor device measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2011 IEEE International
  • Conference_Location
    San Francisco, CA
  • ISSN
    0193-6530
  • Print_ISBN
    978-1-61284-303-2
  • Type

    conf

  • DOI
    10.1109/ISSCC.2011.5746316
  • Filename
    5746316