DocumentCode

2895321

Title

Reliable systems from reliable components

Author

Peck, D.

Author_Institution

Bell Telephone Laboratories, Inc., Allentown, PA, USA

Volume

VII

fYear

1964

fDate

19-21 Feb. 1964

Firstpage

80

Lastpage

81

Keywords

Aging; Circuit testing; Costs; Integrated circuit reliability; Life testing; Manufacturing; Production; Redundancy; Satellites; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Solid-State Circuits Conference. Digest of Technical Papers. 1964 IEEE International

Conference_Location

Philadelphia, PA, USA

Type

conf

DOI

10.1109/ISSCC.1964.1157509

Filename

1157509