• DocumentCode
    2897300
  • Title

    Design For Reliabiltiy

  • Author

    Rennels, David A. ; Tamir, Yuval ; Tyree, Vance C.

  • Author_Institution
    University of California Los Angeles
  • fYear
    1992
  • fDate
    25-28 Oct. 1992
  • Firstpage
    23
  • Lastpage
    28
  • Keywords
    Circuit faults; Computer science; Fabrication; Packaging; Power dissipation; Power system reliability; Senior members; Single event upset; Total quality management; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Wafer Level Reliability Workshop, 1992. Final Report., 1992 International
  • Conference_Location
    Lake Tahoe, CA, USA
  • Type

    conf

  • DOI
    10.1109/IWLR.1992.657980
  • Filename
    657980
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2897300