• DocumentCode
    2899644
  • Title

    Noise and counting statistics of a single electron emitter: Theory

  • Author

    Albert, Mathias ; Flindt, Christian ; Büttiker, Markus

  • Author_Institution
    Dept. de Phys. Theor., Univ. de Geneve, Genève, Switzerland
  • fYear
    2011
  • fDate
    12-16 June 2011
  • Firstpage
    162
  • Lastpage
    167
  • Abstract
    We review the latest progress in understanding the fundamental noise properties of a coherent single electron emitter known as the mesoscopic capacitor. The system consists of a submicron cavity connected to a two-dimensional electron gas via a quantum point contact. When subject to periodic gate voltage modulations, the mesoscopic capacitor absorbs and re-emits single electrons at giga-hertz frequencies as it has been demonstrated experimentally. Recent high-frequency noise measurements have moreover allowed for a precise characterization of the device in different operating regimes. Here we discuss a simple model of the basic charge transfer processes in the mesoscopic capacitor and show how the model is capable of fully reproducing the measured high-frequency noise spectrum. We extend our analysis to the counting statistics of emitted electrons during a large number of periods which we use to discuss the accuracy of the mesoscopic capacitor as a single electron source. Finally, we consider possible applications of the mesoscopic capacitor in future experiments and identify novel pathways for further theoretical research.
  • Keywords
    capacitors; mesoscopic systems; noise measurement; quantum point contacts; charge transfer; counting statistics; high-frequency noise measurements; high-frequency noise spectrum; mesoscopic capacitor; noise properties; quantum point contact; single electron emitter; two-dimensional electron gas; Capacitors; Correlation; Equations; Logic gates; Noise measurement; Phase noise;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Noise and Fluctuations (ICNF), 2011 21st International Conference on
  • Conference_Location
    Toronto, ON
  • Print_ISBN
    978-1-4577-0189-4
  • Type

    conf

  • DOI
    10.1109/ICNF.2011.5994289
  • Filename
    5994289