• DocumentCode
    2900607
  • Title

    Multilayered thin film structures as photonic temperature sensors

  • Author

    Madamopoulos, N. ; Tsigara, A. ; Vainos, N. ; Kaminska, E. ; Piotrowska, A. ; Kibasi, Kahtan

  • Author_Institution
    Theor. & Phys. Chem. Inst., Nat. Hellenic Res. Found., Athens, Greece
  • fYear
    2005
  • fDate
    12-17 June 2005
  • Firstpage
    447
  • Abstract
    Thin multilayered films fabricated by magnetron sputtering were built and tested as passive optical elements for the measurement of temperature variations. They were studied for their performance and integrated into photonic temperature sensors because they can be remotely operated, which is advantageous in harsh environments, and they are immune to electromagnetic interference (EMI).
  • Keywords
    integrated optoelectronics; optical fabrication; optical multilayers; optical sensors; optical testing; temperature sensors; thin films; electromagnetic interference; magnetron sputtering; multilayered thin film structure fabrication; passive optical element testing; photonic temperature sensors; sensor performance; Electromagnetic interference; Electromagnetic measurements; Optical films; Optical sensors; Optoelectronic and photonic sensors; Sputtering; Temperature measurement; Temperature sensors; Testing; Thin film sensors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics Europe, 2005. CLEO/Europe. 2005 Conference on
  • Print_ISBN
    0-7803-8974-3
  • Type

    conf

  • DOI
    10.1109/CLEOE.2005.1568225
  • Filename
    1568225