• DocumentCode
    2901494
  • Title

    Investigation of multipactor effect on return loss degradation on dielectric resonator filters

  • Author

    Keneshloo, R. ; Dadashzadeh, G. ; Okhovvat, M.

  • Author_Institution
    Electr. & Electron. Eng. Dept., Shahed Univ., Tehran, Iran
  • fYear
    2012
  • fDate
    25-28 June 2012
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    The objective of this letter is to study the effect of multipactor on the dielectric resonator filter response. First, a dual-mode cylindrical dielectric resonator waveguide filter is designed and Multipactor breakdown threshold of this filter has been obtained by using effective electrons approach in Monte Carlo method. Then multipactor current density in the radial space between the internal dielectric and the external metallic cavities is calculated. The magnetic field generated by the multipactor current is calculated and its equivalent volume impedance is applied to the solution boundaries and is used in the filter simulation. The simulated results are obtained using the Ansoft simulation software high-frequency structure simulator and clearly show the effect of multipactor on the frequency response of the filter.
  • Keywords
    Monte Carlo methods; current density; dielectric resonator filters; microwave switches; waveguide filters; Ansoft simulation software high-frequency structure simulator; Monte Carlo method; dielectric resonator filter response; dual-mode cylindrical dielectric resonator waveguide filter; external metallic cavity; filter simulation; internal dielectric cavity; multipactor breakdown threshold; multipactor current density; multipactor effect; return loss degradation; Dielectrics; Electric breakdown; Electromagnetic waveguides; Filtering theory; Magnetic separation; Microwave filters; Resonator filters; Effective electron; dielectric resonator; monte carlo; multipactor;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antenna Technology and Applied Electromagnetics (ANTEM), 2012 15th International Symposium on
  • Conference_Location
    Toulouse
  • Print_ISBN
    978-1-4673-0290-6
  • Type

    conf

  • DOI
    10.1109/ANTEM.2012.6262290
  • Filename
    6262290